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Criteria for maximizing the single-line emission of the pinch plasma in plasma focus devices

: Lebert, R.; Bergmann, K.; Rothweiler, D.; Neff, W.

Haines, M. ; American Institute of Physics -AIP-, New York:
Dense z-pinches. Third International Conference 1993
New York/N.Y.: AIP Press, 1994 (AIP Conference Proceedings 299)
ISBN: 1-563-96297-7
S.316-323 : Abb.,Lit.
International Conference on Dense Z-pinches <3, 1993, London>
Fraunhofer ILT ()
ion temperature; magnetic fields; photon; radiation emission; snowplow; x-ray microscopy; z-pinch

The number of photons emitted into one emission line (i.e. NVII 1s-2p at 2.48 nm) per unit area and per unit solid angle per pulse (TISB) is the relevant figure of merit for pulsed x-ray sources used in combination with x-ray optics for x-ray microscopy. Applying a pseudo-two-dimensional plasma bag simulation allows for microscopic understanding of the conditions responsible for x-ray emission and show that maxima of the TISB are achieved at constant kinetic energy per ion with the corresponding values nearly independent of the pinch current. Experiments show that the TISB is scaling proportional to I high 2 under the condition, that the kinetic energy per particle is constant. These two results are discussed in terms of the published I high 4 to I high 2 transition of the scaling of total x-ray yield.