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Contour analysis algorithms for high speed inspection

 
: Kille, K.

Ahlers, R.-J.; Braggins, D.W.; Kamerman, G.W. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Automated 3D and 2D Vision
Bellingham/Wash.: SPIE, 1994 (SPIE Proceedings Series 2249)
ISBN: 0-8194-1555-3
S.380-389
Conference on Industrial Applications of Laser Radar <1994, Frankfurt>
Conference on Automated Visual Inspection <1994, Frankfurt>
Englisch
Konferenzbeitrag
Fraunhofer IPA ()
Algorithmus; High Speed inspection; Hochgeschwindigkeit; Hochgeschwindigkeitsprüfung; Hochgeschwindigkeitstechnologie; inspection; Kontur; Visuelle Prüfung

Abstract
The visual inspection of many industrial products is based on contour analysis. The main task is the detection of defects like cracks and chips. The automation of this visual inspection procedure requires robust and flexible systems and algorithmus. This paper describes new contour analysis algorithms for defect detection. Innovative techniques for contour filtering and analysis (e.g. scale-space analysis) will be presented. The performance of different approaches is shown by several industrial examples and applications.

: http://publica.fraunhofer.de/dokumente/PX-8596.html