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1989
Conference Paper
Titel
Characterization of the elastic behavior of nanocrystalline materials by scanning acoustic microscopy
Alternative
Beschreibung des elastischen Verhaltens von nanokristallinem Werkstoff mit dem akustischen Reflexionsrastermikroskop
Abstract
The V(z)-measurement technique in Scanning Acoustic Microscopy (SAM) was used for an attempt to characterize the elastic behavior of nanocrystalline materials that are polycrystals whose grain sizes comprise a range from 1 to 100 nm. From the periodicity of the V(z)-curves the velocities of surface waves can be deduced. We present the results of such measurements on nanocrystalline Pd-samples which were performed with the Ernst-Leitz SAM at 1.0 and 1.6 GHz. We interprete the observed periodicity as caused by a skimming compressional wave. The deduced phase velocity is about 30% lower than the velocity of compressional bulk waves as determined by time of flight measurements.