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Automatic configuration of systems for texture analysis

 
: Küblbeck, C.; Schittko, O.; Wagner, T.

International Association for Pattern Recognition -IAPR-:
IAPR Workshop on Machine Vision Applications 1996. Proceedings
Tokyo: IAPR, 1996
S.22-25
Workshop on Machine Vision Applications <1996, Tokyo>
Englisch
Konferenzbeitrag
Fraunhofer IIS A ( IIS) ()
adaptive Texturanalyse; adaptive texture analysis; feature selection; learn pattern analysis; lernfähige Mustererkennung; Merkmalselektion

Abstract
Automatic visual inspection plays a growing role in today's efforts to reduce the costs of industrial production. Three to ten months of man power have to be invested for the development of a typical industrial application. In this context, a reduction of time and thus of costs will make it easier to introduce new systems. We show a solution by using several algorithms for two kinds of selection routines, feature selection and training pattern selection.This method offers a convenient way to easily adapt a given system to a special texture analysis task.

: http://publica.fraunhofer.de/dokumente/PX-5205.html