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Applied pattern recognition in senor systems for quality control and automated production systems
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1984
Conference Paper
Titel
Applied pattern recognition in senor systems for quality control and automated production systems
Author(s)
Warnecke, H.-J.
Melchior, K.
Ahlers, R.-J.
Schreiber, L.
Schraft, R.D.
Hauptwerk
Utilization of artificial intelligence and pattern recognition techniques in manufacturing engineering
Konferenz
International Seminar on Manufacturing Systems 1984
Language
English
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Fraunhofer-Institut für Produktionstechnik und Automatisierung IPA