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Zerstörungsfreie und berührungslose Charakterisierung von Schichten mit Hilfe von Mikrowellen

 
: Sklarczyk, C.

Galvanotechnik 89 (1998), Nr.8, S.2542-2548
ISSN: 0016-4232
Deutsch
Zeitschriftenaufsatz
Fraunhofer IZFP ()
coating thickness; microwave; Mikrowelle; Mikrowellenverfahren; nondestructive testing; Schicht; zerstörungsfreie Prüfung

Abstract
By processing the reflected and transmitted components of radiated microwaves, coatings on a range of substrates can be characterised. The method is specially well-suited to on-line process control. In addition to yielding coating thickness data, information on, for example, dielectric properties can also be obtained of a more general characterisation of the coatings is possible. In addition to a straightforward description of coating thickness measurement, an example is quoted for zirconia coatings on steel for which coating thickness varations are demonstrated

: http://publica.fraunhofer.de/dokumente/PX-42392.html