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Title
Anwendung eines Verfahrens zum Messen einer die Kapazitaets-Spannungs-Charakteristik eines kapazitiven Halbleiter-Elementes beeinflussenden Groesse
Date Issued
1992
Author(s)
Schöneberg, Uwe
Hosticka, Bedrich J.
Maclay, Gordon J.
Zimmer, Günter
Patent No
1990-4014395
Abstract
According to the German patent application, the measurement accuracy and the signal-noise ratio is improved in a circuit and a process for the measurement of a parameter affecting the capacitance-voltage characteristic of a capacitive component so that the parameter is determined from the area below the curve of the capacitance-voltage characteristic, whereby, according to the invention of this additional report, the circuit and the process is used for the measurement of ion concentrations in liquids.
Language
de
Patenprio
DE 1990-4014395 A: 19900504