Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Vorrichtung zum Messen von Spannungen in integrierten Schaltungen

Device for the measurement of voltages in integrated circuits
 
: Fritz, J.; Lackmann, R.

:
Frontpage ()

DE 1989-3920495 A: 19890622
DE 1989-3920495 A: 19890622
DE 3920495 C1: 19901004
G01R0031
Deutsch
Patent, Elektronische Publikation
Fraunhofer IMS ()

Abstract
A device permits the non-destructive measurement of absolute voltages, particularly on conductors in CMOS circuits. It comprises a laser device, an electro- optical active crystal and an interference set-up for generating an interference between the laser beam and one of the beams reflected by the integrated circuit, such interference serving as a guide for the voltage to be measured.

: http://publica.fraunhofer.de/dokumente/PX-40734.html