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A VMEbus based laser beam test system for IC failure analysis

 
: Fritz, J.; Lackmann, R.

VMEbus in Industry
1989
S.217-224
International VMEbus in Industry <1989, Paris>
Englisch
Konferenzbeitrag
Fraunhofer IMS ()

Abstract
As an approach towards automated contactless IC probing we describe a laser beam test system for failure analysis in digital CMOS circuits coupled to the CAD data base. The CAD coupling was realized between a VME host and a VAX computer. Task control and image processing is done by a VME control process. After introducing the hard- and software of the realized configuration a typical application example explains the system performance.

: http://publica.fraunhofer.de/dokumente/PX-40313.html