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Title
Verfahren zur Ermittlung von Materialkennwerten in mikroskopisch dimensionierten Prueflingsbereichen
Date Issued
1997
Author(s)
Dost, M.
Kaempfe, B.
Kuehnert, R.
Michel, B.
Traenkner, K.
Patent No
1996-19614897
Abstract
The method is carried out in steps, and includes determining the field distribution of the displacement vectors within the specimen region (A) also determining the material characteristic values (v,a) which represent a function of the displacement, from the determined field distribution of the displacement vectors. The method includes determining the field distribution of the displacement vectors using the processing of digitised images (B1,B2), resulting as two dimensional image matrices with discrete pixel values, which are allocated a grey value scale. A first digitised image (B1) of the specimen region (A) is produced in one condition. Additionally a second digitised image (B2) of the specimen region is produced in a second condition. This differs from the first condition by the deformation of the specimen (1). The determination of the displacement vectors of the local deformation results from comparison of the first with the second digitised image. ADVANTAGE - Values obtained by m easuring and evaluating deformation fields in microscopic surface regions of specimen.
Language
de
Patenprio
DE 1996-19614897 A: 19960416