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Title
Verfahren und Vorrichtung fuer die Emissionsspektroskopie
Date Issued
1997
Author(s)
Noll, Reinhard
Patent No
1991-4118518
Abstract
Process for emission spectroscopy, in particular laser emission spectroscopy, in which radiation (40) emitted by the laser-induced plasma of the substance under analysis is split up by a spectrometer (10) and at least one part of the determined spectrum is transferred to a processing device (31, 45) for element analysis. In order to optimize the process with regard to measurement accuracy and speed, it is designed so that the intensity of the plasma-forming laser radiation (2) is influenced for the generation of defined plasma states in dependence of at least one emission-influencing parameter which is measured during plasma formation and that the determined spectrum or part of the same is transferred to the processing device (31, 45) if the measured plasma parameter lies within a predetermined tolerance range (T<-1 ./.T<-2 ).
Language
de
Institute
Patenprio
DE 1991-4118518 A: 19910606