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Two and three-dimensional measurements by picture processing systems

 
: Warnecke, H.-J.; Keferstein, C.P.; Pavel, G.

Japan Society of Precision Engineering -JSPE-, Tokyo:
ISMOC '84. International IMEKO-Symposium on Metrology for Quality Control in Production. Proceedings : IMEKO, Technical Committee TC.14
Tokyo, 1984
S.139-145 : Abb.,Lit.
International Symposium on Metrology for Quality Control in Production <1984, Tokyo>
Englisch
Konferenzbeitrag
Fraunhofer IPA ()

: http://publica.fraunhofer.de/dokumente/PX-37164.html