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1991
Conference Paper
Titel
Study of non-isothermal oxidation kinetics using a fast X-ray diffraction method
Alternative
Untersuchung der nichtisothermen Oxidationskinetik unter Einsatz der schnellen Diffraktionsmethode
Abstract
The surface structure of Fe samples was followed by X- ray diffraction during heating from 50 to 550degreeC. The oxidation products could be identified in situ. The difference method yields curves Y(T) showing the global change during the heating process. These curves were calibrated to the microscopically measured end thickness of the oxide layer yielding a curve x(T). A theoretical curve including the Arrhenius relation was fitted to the x(T)-curve yielding activation energy and values of the oxidation rate constant as a function of temperature.The measuring system consists of a Siemens D500 diffractometer equipped with a high temperature device. The computer controlled system allows a fast acquisition of series of energy- or angle-dispersive x-ray diffraction patterns. Linear and stepwise heating with different steps and heating rates can be selected within a temperature interval of 20 and 1700 degreeC as well as isothermal programs.