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AFM - Abbildung feinster Strukturen

 
: Gesang, T.; Höper, R.; Possart, W.; Hennemann, O.-D.

Adhäsion. Kleben und Dichten 39 (1995), Nr.5, S.40-44
ISSN: 0001-8198
ISSN: 0943-1454
Deutsch
Zeitschriftenaufsatz
Fraunhofer IFAM ()
Fraunhofer IZM, Einrichtung Polymermaterialien und Composite ( Fraunhofer EPC) ()
Adhäsion; adhesion; adsorption; AFM; aluminium coating; Copolymer; dip coating; Film; Filmbindung; prepolymer; Rasterkraftmikroskopie; silicon wafer; Silizium-Wafer; spin coating

Abstract
Atomic Force Microscopy allows novel investigations into birth and growth of ultrathin polymeric films. This bears relevance both for coatings and for adhesive bonding technology. The article describes the initial stages of prepolymeric film growth on silicon wafers and aluminum evaporation layers which have been selected for their application orientation. The prepolymer chosen is based on the dicyanate of bisphenole A and is a potential ingredient for high temperature adhesives. The initial stages of film growth have been accomplished by adsorption out of solution. The application techniques either realize adsorption with significant centrifugal forces ("Spin Coating`) or in nearly equilibrated condition ("Dip-Coating"). The investigations reveal the respective kind of growth which highly depends on the type of substrate and on the application technique.

: http://publica.fraunhofer.de/dokumente/PX-3422.html