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1991
Conference Paper
Titel
Soft-X-ray diagnostics of a nitrogen pinchplasma source for imaging X-ray microscopy
Abstract
Pinch plasmas are sources of high brilliance for soft x-rays in the wavelength range from Lambda is equal to 0.1 nm to 20 nm. A plasma focus device emitting line radiation of hydrogen-like nitrogen at Lambda is equal to 2.5 nm into the water window region has been developed as a source for a laboratory imaging x-ray microscope. Several diagnostic methods as transmission gratings, zone plate optics and x-ray streak camera are applied to measure and maximize the brilliance of the line emission of the source.