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Active probes for 2-port network analysis within 70-230 GHZ

Aktive Meßspitzen für die 2-Tor-Netzwerkanalyse von 70-230 GHz


Matloubian, M. ; Institute of Electrical and Electronics Engineers -IEEE-; IEEE Microwave Theory and Techniques Society:
IEEE MTT-S International Microwave Symposium Digest 1999. Vol.4
Piscataway, NJ: IEEE, 1999
ISBN: 0-7803-5135-5
ISBN: 0-7803-5136-3
S.1635-1638 : Ill.
International Microwave Symposium <1999, Anaheim/Calif.>
Fraunhofer IAF ()
network analysis; Netzwerkanalyse; S-parameter measurement; S-Parameter-Messung

Active probes for 2-port on-wafer network analysis within 70-230 GHz are presented. The probe contains an integrated circuit based on nonlinear transmission lines (NLTL) which has all elements of an S-parameter test set. 2-port measurements with these active probes were carried out. Compared to earlier act probe systems, measurement accuracy is greatly improved.