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Reliability of inner lead gang and single point bonded contacts

 
: Beutler, U.; Zakel, E.; Reichl, H.

6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis '93. Proceedings
1993
S.297
Quality in Electronic Components Failure Prevention, Detection and Analysis <1993, Bordeaux>
Englisch
Konferenzbeitrag
Fraunhofer IZM ()

: http://publica.fraunhofer.de/dokumente/PX-31695.html