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Properties of Mg and Zn acceptors in MOVPE GaN as studied by optically detected magnetic resonance

Eigenschaften von Mg und Zn Akzeptoren in MOVPE GaN untersucht mittels optisch detektierter magnetischer Resonanz


Solid-State Electronics 41 (1997), Nr.2, S.189-193
ISSN: 0038-1101
Fraunhofer IAF ()
acceptor; Akzeptor; GaN; Mg; ODMR; photoluminescence; Photolumineszenz; Zn

We have studied the photoluminescence (PL) and optically detected magnetic resonance (ODMR) of undoped, n-doped and p-doped thin wurtzite GaN layers grown by metal-organic chemical vapor deposition on sapphire substrates. The ODMR data obtained for undoped, Mg-doped and Zn-doped GaN layers provide an insight into the recombination mechanisms responsible for the broad yellow (2.25 eV), the violet (3.15 eV) and the blue (2.8 eV) PL bands, respectively. The ODMR results for Mg and Zn also show that these acceptors do not behave effective mass like and indicate that the acceptor hole is mainly localized in the nearest neighbor shell surrounding the acceptor core. In addition concentration effects in heavily doped GaN:Mg have been studied.