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Progen, a program generator to generate conversion programs for test patterns

: Lackmann, R.; Rennett, T.; Schmitz, C.

Institute of Electrical and Electronics Engineers -IEEE-:
IEEE Instrumentation and Measurement Technology Conference 1992. Conference Record
New York/N.Y.: IEEE, 1992
ISBN: 0-7803-0640-6
ISBN: 0-7803-0641-4
ISBN: 0-7803-0642-2
Instrumentation and Measurement Technology Conference (IMTC) <9, 1992, New York/N.Y.>
Fraunhofer IMS ()
conversion program; description language; easy-format-description language; interchange format; Konvertierungsprogramm; program generator; Programmgenerator; Spezifikationssprache; test patterns; Zwischenformat

The different test pattern data formats of circuits simulators which do not coincide with those used by the test systems constitute a problem to test automation of digital circuits. In this paper the program generator PROGREN is introduced which generates programs to convert simulator output data into the CADDIF format (computer aided design data interchange format). CADDIF is a simulator- and tester-independent data format. Based upon this general data structure the test patterns can be adapted to any test system with the help of suitable programs.