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Precise impedance measurement of dielectric materials under high field intensities by using self-calibration

 
: Liu, J.-G.; Schönecker, A.

Daponte, P. ; International Measurement Confederation -IMEKO-, Technical Committee on Measurement of Electrical Quantities -TC 4-:
10th International Symposium on Development in Digital Measuring Instrumentation and 3rd Workshop on ADC Modelling and Testing 1998. Proceedings. Vol.1
Naples, 1998
S.9-13
International Symposium on Development in Digital Measuring Instrumentation (ISDDMI) <10, 1998, Naples/Italy>
Workshop on ADC Modelling and Testing <3, 1998, Naples/Italy>
Englisch
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Fraunhofer IKTS ()

: http://publica.fraunhofer.de/dokumente/PX-29188.html