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Practical and theoretical aspects of applied image analysis

: Warnecke, H.-J.; Rueff, M.; Muessigmann, U.; Melchior, K.

Measurement 5 (1987), Nr.1, S.20-29 : Abb.,Lit.
ISSN: 0263-2241
Fraunhofer IPA ()

It is demonstrated how special industrial measurement tasks can be solved by Image Analysis Systems. Software for Vision Systems is discussed. Especially the Image Analysis Software Library developed at the Fraunhofer Institute for Manufacturing, Engineering and Automation (IPA) is presented and compared with other libraries. Some examples are given concerning scale invariant pattern recognition as well as the description of structures by their fractal dimension. The concept of fractal dimension is applied to optical surface roughness measurements. First results are very surprising and it is suggested to increase the efforts to introduce this concept in wider fields of measurement. (IPA)