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3D-Formvermessung mittels Zwei-Wellenlängen-ESPI-Technik

: Maack, T.; Notni, G.; Schreiber, W.

Deutsche Gesellschaft für Angewandte Optik -DGaO-:
95. DGaO-Tagung
Berchtesgaden, 1994
Deutsche Gesellschaft für Angewandte Optik (Jahrestagung) <95, 1994, Berchtesgaden>
Fraunhofer IOF ()
contouring; Formvermessung; optical three-coordinate measurement; optische 3D-Koordinatenmessung; rauhe Oberfläche; rough surface; speckle; speckle-Interferometrie; speckle interferometry; two-source method; two-wavelength method; Zwei-Quellen-Methode; Zwei-Wellenlängen-Methode

A system for three-coordinate measurement will be presented which is suitable for the contouring of rough surface objects.The system is based on the combination of the methods of source transformation and wavelength shift.This makes it possible to illuminate and to view the object without shading. The generation of a synthetic wavelength by suitably choosing the difference of the wavelengths allows a variable sensitivity and hence an adjustment to the contour to be measured.The maximum accuracy of the system will be stated.First results with objects having a diameter of less than 5 cms will be shown.