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1989
Conference Paper
Titel
3D - CMOS devices in recrystallized silicon
Abstract
A 2 mym 3D-CMOS process has been developed which allows the fabrication of MOS devices in two independent active device layers. NMOS transistors have been fabricated in the substrate and CMOS devices as inverters and ring oscillators in a thin laser recrystallized polysilicon layer. The processing parameters were determined carefully in order to obtain a monocrystalline top layer and to avoid any damage to the underlying devices already existing.
Konferenz
Language
English