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On-chip emulation and debugging for embedded microcontrollers using the IMS ScanDebugger

 
: Sievert, K.; Manoli, Y.; Both, A.W.; Lerch, R.G.

Association for Computing Machinery -ACM-, Special Interest Group on Design Automation -SIGDA-; IEEE Computer Society:
The European Design and Test Conference, ED&TC 1995. Proceedings : Paris, France, March 6 - 9, 1995
Los Alamitos, Calif.: IEEE Computer Society Press, 1995
ISBN: 0-8186-7039-8
ISBN: 0-7803-2539-7
S.229-232
European Design and Test Conference (ED&TC) <2, 1995, Paris>
Englisch
Konferenzbeitrag
Fraunhofer IMS ()
ASIC; built-in test equipment; digital integrated circuits; digitale integrierte Schaltung; Emulation; Fehlersuche; IEEE 1149.1; ITAG; microcontrollers; Mikrocontroller; Prüfschaltung; test circuits; trouble shooting

Abstract
We present an on-chip emulation strategy using the ASICs built-in chip test support circuitry. Scan-paths, widely used to achieve testability for ASICs, can be used to view and modify the chip state for debugging and verification purposes. With the interactive IMS ScanDebugger, we present a software tool that adds emulator functionality to scanable ASICs. We suggest using an IEEE 1149.1 Boundary Scan Test compatible test interface.

: http://publica.fraunhofer.de/dokumente/PX-27095.html