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Nuclear magnetic resonance study of self diffusion in the semiconductors tellurium and selenium

Kernmagnetische Resonanz Untersuchung der Selbstdiffusion in den Halbleitern Tellur und Selen
: Kanert, O.; Günther, B.

The Metallurgical Society:
13th International Conference on Defects in Semiconductors '84. Vol.14a. Proceedings
S.317-323 : Abb.,Tab.,Lit.
International Conference on Defects in Semiconductors <13, 1984, Coronado/Calif.>
Fraunhofer IFAM ()
diffusion; Kernspinrelaxation; Kernspinresonanz; NMR; Selbstdiffusion; Selen; Tellur

Self diffusion in monocrystalline tellurium and selenium, respectively, has been investigated with site-selective NMR techniques that allow a direct measurement of atomic jump frequencies with a high degree of accuracy. The diffusion coefficients DNMR thus obtained in tellurium are in excellent agreement with recently performed 127Te radio-tracer measurements parallel to the hexagonal c-axis supporting the 1V-1N, 2N-diffusion model. In contrast, for selenium DNMR is about a factor of 20 smaller than earlier tracer data.