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New results of field-induced deformation of nematic liquid crystals for testing of digital integrated circuits

 
: Wieberneit, M.; Lackmann, R.

Institute of Electrical and Electronics Engineers -IEEE-, Switzerland Section, Reliability Chapter, Zürich:
European Conference on Electron and Optical Beam Testing of Electronic Devices. Conference Preprints
Zürich, 1993
S.9/6-9/9 : Lit.
European Conference on Electron and Optical Beam Testing of Electronic Devices <4, 1993, Zürich>
Englisch
Konferenzbeitrag
Fraunhofer IMS ()
Auflösungsvermögen; DAP-Effekt; DEBUG-Testmethode; Doppelbrechung; double refraction; ECB-Effekt; electrooptical system; elektrooptisches System; Flüssigkristallbauelement; Funktionsprüfung; integrated circuit; integrierte Schaltung; Mikroskopie; Molekularrotation; optische Anisotropie; optische Drehung; Testen

Abstract
This paper deals with a nematic liquid crystal between line structure and backplate electrode. Experimental results for an optimum spatial resolution including a simple model will be presented providing new preparation method and analysis technique for digital circuits.

: http://publica.fraunhofer.de/dokumente/PX-26232.html