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A multifrequency approach to interpret defect signals according to the causing defect type and size
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1981
Book Article
Titel
A multifrequency approach to interpret defect signals according to the causing defect type and size
Author(s)
Betzold, K.
Hauptwerk
Eddy-Current characterization of materials and structures
Language
English
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Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP