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Moire deflectometry based on Fourier-transform analysis

: Wang, B.; Luo, X.; Pfeifer, T.; Mischo, H.


Measurement 25 (1999), Nr.1, S.249-253
ISSN: 0263-2241
Fraunhofer IPT ()
Fourier transform; least square fitting; moire deflectometry; phase-shifting

An approach for moire deflectometry based on Fourier-transform analysis is described. Fourier-transform is used for analyzing and evaluating both infinite and finite moire deflectograms. Deflections in two orthogonal directions are integrated to reconstruct the tested surface. A least square fitting is used in finite moire deflectogram to eliminate declination error caused by inclination between two Ronchi grating lines. Results from experiments of aspheric surface measurement based on this approach have proved its effectiveness.