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Microsystem-test, effective with HP82000-configurations and VEE

 
: Baumgart, K.; Herrlich, B.; Werner, W.-D.

Hewlett-Packard:
HP 82000/83000 User Group Meeting 1997
Schwaig, 1997
HP 82000/83000 User Group Meeting <1997, Schwaig>
Englisch
Konferenzbeitrag
Fraunhofer IMS, Außenstelle Dresden ( IPMS) ()
Digitaltester; Mikrosystemtest; mixed-signal-test

Abstract
The presentation gives an overview about the verification, measurement and automatic wafertest of high-Speed ASICs, HF-devices, mixed-signal-ICs, integrated sensor- and microsystems with one testsystem and different configurations.

: http://publica.fraunhofer.de/dokumente/PX-24005.html