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Implementation of flip chip technology into volume manufacturing demonstration of processes

: Jung, E.; Heinricht, K.; Kutzner, K.; Klöser, J.; Aschenbrenner, R.; Reichl, H.; Brommelhaus, A.

Deutscher Verband für Schweißtechnik e.V. -DVS-, Düsseldorf:
EuPac '98. 3rd European Conference on Electronic Packaging Technology & 9th International Conference on Interconnection Technology in Electronics. Lectures and poster
Düsseldorf: DVS-Verlag, 1998 (DVS-Berichte 191)
ISBN: 3-87155-497-9
European Conference on Electronic Packaging Technology (EuPac) <3, 1998, Nürnberg>
International Conference on Interconnection Technology in Electronics <9, 1998, Nürnberg>
Fraunhofer IZM ()
electroless deposition; encapsulation; flip-chip devices; integrated circuit interconnections; integrated circuit metallisation; integrated circuit packaging; microassembling; Soldering; surface cleaning; surface mount technology

Until now, use of flip chip technology has not been widespread in volume manufacturing, although it provides a number of significant advantages over standard surface mount devices. In particular, the cost aspect of using flip chip technology in a large scale manufacturing environment is expected to overcome the remaining issues. In order to illustrate the equipment and processes involved for incorporation of flip chip attachment into a production process, a demonstration center was established at FhG-IZM. Critical process steps were identified and addressed. This article gives a detailed insight into the actual implementation of a flip chip process into a SMD compatible production line, highlighting aspects of bump provision, cleaning, chip placement and underfilling. Bumping covers low cost processes such as electroless nickel as under-bump metallization (UBM) and stencil printed solder deposits using advanced printing technology. The necessity of cleaning and the key aspects for achievement of high reliability with industrial applied processes is highlighted. Required features of the placement machine and related critical issues are presented. Underfill application is also covered, focussing on important aspects for process optimization.