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Defect categorization. Making use of a decade of widely varying historical data

: Seaman, C.B.; Shull, F.; Regardie, M.; Elbert, D.; Feldmann, R.L.; Guo, Y.; Godfrey, S.


Association for Computing Machinery -ACM-; Institute of Electrical and Electronics Engineers -IEEE-:
ESEM 2008, ACM-IEEE 2nd International Symposium on Empirical Software Engineering and Measurement. Proceedings : October 9-10, 2008, Kaiserslautern, Germany
New York: ACM Press, 2008
ISBN: 978-1-59593-971-5
International Symposium on Empirical Software Engineering and Measurement (ESEM) <2, 2008, Kaiserslautern>
Fraunhofer IESE ()

This paper describes our experience in aggregating a number of historical datasets containing inspection defect data using different categorization schemes. Our goal was to make use of the historical data by creating models to guide future development projects. We describe our approach to reconciling the different choices used in the historical datasets to categorize defects, and the challenges the faced. We also present a set of recommendations for others involved in classing defects.