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Quantitative Determination of Contact Stiffness Using Atomic Force Acoustic Microscopy

: Rabe, U.; Amelio, S.; Kester, E.; Scherer, V.; Hirsekorn, S.; Arnold, W.


Ultrasonics 38 (2000), Nr.1-8, S.430-437
ISSN: 0041-624X
Fraunhofer IZFP ()
acoustics; Atomic Force Acoustic Microscopy; Beams; Contact Stiffness; Flexural Vibrations; ultrasonics; Young's modulus

Atomic force acoustic microscopy is a near-field technique which combines the ability of ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We present a technique to measure the contact stiffness and the Young's modulus of sample surfaces quantitatively, with a resolution of approximately 20 nm, exploiting the contact resonance frequencies of standart cantilevers used in atomic force microscopy. The Young's modulus of nanocrystalline ferrite films has been measured as a function of oxidation temperature. Furthermore, images showing the domain structure of piezoelectric lead zirconate titanate ceramics have been taken.