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Fast illuminated lock-in thermography

An inline shunt detection measurements tool
 
: Seren, S.; Hahn, G.; Demberger, C.; Nagel, H.

:

IEEE Electron Devices Society:
33rd IEEE Photovolatic Specialists Conference, PVSC 2008. Proceedings. Vol.3 : San Diego, CA, May 11 - 16, 2008
Piscataway, NJ: IEEE, 2008
ISBN: 978-1-4244-1640-0
ISBN: 978-1-4244-1641-7
ISBN: 1-4244-1640-X
S.1360-1363
Photovoltaic Specialists Conference (PVSC) <33, 2008, San Diego/Calif.>
Englisch
Konferenzbeitrag
Fraunhofer ISE ()

Abstract
This paper focuses on the fast spatially resolved detection of material and / or processing induced shunting using fast illuminated Lock-In Thermography (iLIT). With this technique shunting can be detected spatially resolved within a measurement time of only 1 s and thus the method in principle can be used for inline characterisation. Points addressed are the influence of Lock-In frequency on spatial resolution and the effect of a lowered illumination intensity for a better selectivity between shunting and recombination induced generation of heat. The method is tested for different common sources of shunting in standard industrial-type solar cells (points like shunts, cracks, poor edge isolation, contaminations) and all major types of shunts under investigation can be detected in times relevant for inline characterisation.

: http://publica.fraunhofer.de/dokumente/N-89831.html