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Electronic transport properties in copper nanowire

: Mohammadzadeh, S.; Pouladsaz, D.; Streiter, R.; Gessner, T.


Schulz, S.E.:
MAM2008, Proceedings of the Twelth European Workshop on Materials for Advanced Metallization 2008 : A single-session workshop devoted to materials research, materials properties and interactions. March 2 - 5, 2008, Dresden, Germany
Amsterdam: Elsevier, 2008 (Microelectronic engineering 85.2008, Nr.10)
ISSN: 0167-9317
European Workshop on Materials for Advanced Metallization (MAM) <12, 2008, Dresden>
Konferenzbeitrag, Zeitschriftenaufsatz
Fraunhofer IZM ()
Fraunhofer ENAS ()

In present work, we study the electronic transport properties of copper nanowire using the non-equilibrium Green's function technique on the density functional tight binding method for modelling the conductance under external bias voltage. We also carried out the calculations for the Au nanowire for comparison.