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Excitation of atomic force microscope cantilever vibrations by a Schottky barrier

 
: Schwarz, K.; Rabe, U.; Hirsekorn, S.; Arnold, W.

:
Volltext urn:nbn:de:0011-n-761170 (258 KByte PDF)
MD5 Fingerprint: c0438f71df3eaa54856f32bdbe68a101
Copyright AIP
Erstellt am: 8.7.2008


Applied Physics Letters 92 (2008), Nr.18, Art. 183105, 3 S.
ISSN: 0003-6951
ISSN: 1077-3118
Englisch
Zeitschriftenaufsatz, Elektronische Publikation
Fraunhofer IZFP ()
Atomic Force Acoustic Microscopy; AFAM

Abstract
We have developed a method to excite cantilever vibrations for dynamic force microscopy. A n-doped silicon cantilever is coated by platinum. At the interface, a Schottky barrier forms whose depletion layer couples to the elastic strain mainly by Maxwell stress and by electrostriction. If a sinusoidal voltage is applied to the Schottky barrier, the cantilever is excited to periodic vibrations due to the transverse strain generated parallel to the length axis of the cantilever. In atomic force acoustic microscopy contact-resonance spectroscopy, this technique delivers clean resonance spectra devoid of spurious signals.

: http://publica.fraunhofer.de/dokumente/N-76117.html