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Model-based design of measurement systems

 
: Schneider, P.; Eichler, U.; Einwich, K.; Schwarz, P.

AMA Fachverband für Sensorik e.V., Wunstorf:
SENSOR 2005. 12th international conference. Proceedings : Nürnberg, Germany, 10 - 12 May 2005
Wunstorf: AMA Service GmbH, 2005
S.323-328 (Vol.II)
Sensor-Kongress <12, 2005, Nürnberg>
Englisch
Konferenzbeitrag
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()
SystemC AMS

Abstract
The efficiency of the design of new measurement and test equipment can be improved substantially by computer-aided design, particularly by using tools for simulation and optimization. Modeling of the entire system comprising the device under test (DUT), the measurement instrument and signal processing agorithms allow system level simulation. Using simulation suitable measuring quantities can be selected, signal processing algorithms can be developed and different system concepts can be tested by dedicated modification of DUT model parameters. A similar method is known from electronics as "virtual test". In this paper we describe the use of simulation tools as MATLAB/SIMULINK and SystemC-AMS within the design of two measurement systems.

: http://publica.fraunhofer.de/dokumente/N-75424.html