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Quantitative carrier lifetime images optically measured on rough silicon wafers
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2007
Journal Article
Titel
Quantitative carrier lifetime images optically measured on rough silicon wafers
Author(s)
Schubert, Martin C.
Pingel, Sebastian
The, Manuel
Warta, Wilhelm
Zeitschrift
Journal of applied physics
DOI
10.1063/1.2748867
Language
English
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Fraunhofer-Institut für Solare Energiesysteme ISE
Tags
Siliciummaterialcharakterisierung