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Optical confinement in recrystallised wafer equivalent thin film solar cells

: Janz, S.; Kuenle, M.; Peters, M.; Lindekugel, S.; Mitchell, E.J.; Reber, S.

Volltext urn:nbn:de:0011-n-734854 (355 KByte PDF)
MD5 Fingerprint: 552e14dd500128fe8d63ee0727f332cc
Erstellt am: 26.9.2012

European Commission, Joint Research Centre -JRC-:
The compiled state-of-the-art of PV solar technology and deployment. 22nd European Photovoltaic Solar Energy Conference, EU PVSEC 2007. Proceedings of the international conference. CD-ROM : Held in Milan, Italy, 3 - 7 September 2007
München: WIP-Renewable Energies, 2007
ISBN: 3-936338-22-1
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <22, 2007, Milano>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ISE ()

Bragg reflectors were used to enhance rear-side optical confinement in crystalline silicon thin film solar cells. Besides the enhancement of reflectivity in the long wavelength region, the layer stack acts as a diffusion barrier. We designed two different Bragg reflectors which were deposited on different silicon substrates. By adjusting the thickness of the single layers and their refractive indices an optimum reflected wavelength region exceeding 800 nm can be created. The amount of reflected light from the Bragg reflectors deposited on the silicon substrates was measured in a spectrophotometer and confirmed the enhancement of reflectivity from around 20% (single layer) to around 70% (Bragg reflector). During fabrication of the crystalline silicon thin-film solar cells additional high temperature processes are necessary which have significant influence on the optical properties of the single layers and therefore of our Bragg reflectors. Although the processing reduces the positive effects of the not yet optimised Bragg reflectors we achieved an increase in Jsc compared to a single layer of up to 4 mA/cm2.