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Investigations of diffusion barriers for application in back-contacted solar cells

: Drießen, M.; Mingirulli, N.; Pingel, S.; Schubert, M.; Biro, D.; Preu, R.

Volltext urn:nbn:de:0011-n-734639 (614 KByte PDF)
MD5 Fingerprint: 66cb45eafd5bff70387de765618d801d
Erstellt am: 22.9.2012

European Commission, Joint Research Centre -JRC-:
The compiled state-of-the-art of PV solar technology and deployment. 22nd European Photovoltaic Solar Energy Conference, EU PVSEC 2007. Proceedings of the international conference. CD-ROM : Held in Milan, Italy, 3 - 7 September 2007
München: WIP-Renewable Energies, 2007
ISBN: 3-936338-22-1
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <22, 2007, Milano>
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ISE ()

The characterization of barriers against phosphorus diffusion for application in back-contacted solar cells by using the sheet resistance imaging (SRI) method is investigated. The focus is set on a screen-printable TiOxlayer, which is compared to a thermally grown and photolithographically patterned SiO2-layer. Within the measurement error the effectiveness of the TiOx-layer as a diffusion barrier is proven. The high resolution of the SRI allows to observe structures in the diffused areas of very small scale.