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Integrating end-of-life evaluation in conceptual design

 
: Krause, F.-L.; Hayka, H.; Langenberg, D.

IEEE Computer Society, Technical Committee on Electronics and the Environment; International Association of Electronics Recyclers -IAER-:
IEEE International Symposium on Electronics and the Environment 2006. Proceedings : 8 - 11 May 2006. San Francisco, California, USA . Held in conjunction with the 7th Electronics Recycling Summit
Piscataway, NJ: IEEE Operations Center, 2006
ISBN: 1-4244-0351-0
S.245-250
International Symposium on Electronics and the Environment (ISEE) <14, 2006, San Francisco/Calif.>
Electronics Recycling Summit <7, 2006, San Francisco/Calif.>
Englisch
Konferenzbeitrag
Fraunhofer IPK ()

: http://publica.fraunhofer.de/dokumente/N-67808.html