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In situ measurement of growth and residual stresses in oxide scales by high temperature x-ray diffraction
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2000
Conference Paper
Titel
In situ measurement of growth and residual stresses in oxide scales by high temperature x-ray diffraction
Author(s)
Kolarik, V.
Lopez, D.
Fietzek, H.
Juez-Lorenzo, M.
Hauptwerk
Materials and Coatings for Extreme Environments. International Conference
Konferenz
International Conference "Materials and Coatings for Extreme Environments" 2000
Language
English
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Fraunhofer-Institut für Chemische Technologie ICT