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Detailed study of differently grown InN wavers as strong THz surface emitters excited at 800 nm and 1060 nm

 
: Matthäus, G.; Pradarutti, B.; Brückner, C.; Riehemann, S.; Notni, G.; Nolte, S.; Cimalla, V.; Lebedev, V.; Ambacher, O.; Tünnermann, A.

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Institute of Electrical and Electronics Engineers -IEEE-:
Joint 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics 2006. Proceedings. Vol.2 : Shanghai, China, 18 - 22 September 2006
Piscataway, NJ: IEEE, 2006
ISBN: 1-4244-0399-5
ISBN: 1-4244-0400-2
S.369
International Conference on Infrared and Millimeter Waves (IRMMW) <31, 2006, Shanghai>
International Conference on Terahertz Electronics (THz) <14, 2006, Shanghai>
Englisch
Konferenzbeitrag
Fraunhofer IOF ()

: http://publica.fraunhofer.de/dokumente/N-65448.html