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Pulsewidth and stability properties of external-cavity mode-locked semiconductor lasers

Simulations and experiments
 
: Mulet, J.; Kroh, M.; Mork, J.

:

Institute of Electrical and Electronics Engineers -IEEE-:
Conference on Lasers and Electro-Optics Europe 2005 : 12 - 17 June 2005, Munich, Germany
Piscataway, NJ: IEEE Operations Center, 2005
ISBN: 0-7803-8974-3
ISBN: 978-0-7803-8974-8
S.7
Conference on Lasers and Electro-Optics Europe (CLEO Europe) <2005, München>
Englisch
Konferenzbeitrag
Fraunhofer HHI ()

: http://publica.fraunhofer.de/dokumente/N-64891.html