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Combining GPU-based full-field and strain-controlled 2D-DIC for simplified crack growth experiments

Paper presented at Photomechanics IDICS Conference, 3-5 November 2021, Nantes, France
: Blug, Andreas; Conrad, Fabian; Regina, David Joel; Bertz, Alexander; Kontermann, Christian; Carl, Daniel; Oechsner, Matthias

Volltext urn:nbn:de:0011-n-6409241 (545 KByte PDF)
MD5 Fingerprint: 2dbd217a63dfeac5f42c6288db831b46
Erstellt am: 9.10.2021

2021, 2 S.
Photomechanics IDICS Conference <2021, Nantes>
Vortrag, Elektronische Publikation
Fraunhofer IPM ()
high-speed DIC; in-situ measurement; Strain-Control; finite-element model

The combination of a 2D digital image correlation (DIC) system based on a graphics processing unit (GPU) with a CoaXPress 2.0 camera acquiring up to 3 GB/s of image data enables a real-time evaluation of both, integral strain for strain-control and full-field DIC on images selected automatically in real-time. This combination enables the use of one single sensor for strain-controlled crack growth and crack characterization. The full-field displacement is compared to a finite-element model (FEM) using the crack contour measured by the DIC system.