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A reference test setup and comparison between different HPEM testing schemes

: Hurtig, Tomas; Pusch, Thorsten; Schaarschmidt, Martin; Elfsberg, Mattias; Wellander, Niklas; Suhrke, Michael


Institute of Electrical and Electronics Engineers -IEEE-:
International Symposium on Electromagnetic Compatibility - EMC EUROPE 2020. Proceedings : September 23-25, 2020, Virtual Conference
Piscataway, NJ: IEEE, 2020
ISBN: 978-1-7281-5579-1
ISBN: 978-1-7281-5578-4
ISBN: 978-1-7281-5580-7
Paper 344, 5 S.
International Symposium on Electromagnetic Compatibility (EMC Europe) <2020, Online>
Fraunhofer INT ()
HPEM; HPM; immunity testing; measurement uncertainty; reference setup; standard development; test method

Schemes for probing immunity of electronic devices against high power electromagnetics have been developed and refined over the years. Several test environments are available, some not yet fully acknowledged in standard documents or laboratory practice. In order to further their development and to facilitate exchange across laboratories and methods, a new reference test setup representing a modern, generic IT system has been designed. A comparison between failure modes and failure levels under two different testing schemes is presented. Testing has been performed using direct radiation in a TEM waveguide and also in a reverberation chamber. Overall, the two methods of testing show very similar results with respect to failure levels.