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Challenges and solution approaches for simulation-based reliability assessment - degradation modeling

Paper presented at IEEE International Integrated Reliability Workshop, IIRW 2020, 4 October - 1 November 2020, virtual conference
 
: Lange, André; Jancke, Roland

:
Volltext urn:nbn:de:0011-n-6181266 (406 KByte PDF)
MD5 Fingerprint: 424ac81a4c3c50bd5be3e0aa8e3ffb66
Erstellt am: 9.12.2020

Poster urn:nbn:de:0011-n-618126-12 (244 KByte PDF)
MD5 Fingerprint: 6e82f412e7d99e540056ecc782e6bdaf
Erstellt am: 9.12.2020


2020, 3 S.
International Integrated Reliability Workshop (IIRW) <2020, Online>
European Commission EC
100375234; ARAMID
radAR für AutonoMes fahren - eInsetzbar von jeDermann
Bundesministerium fur Wirtschaft und Energie BMWi (Deutschland)
03TNK017; ELDA-MP
Entwicklung eines Standards für ein elektronisches Datenformat zur Beschreibung von Mission Profiles
Englisch
Konferenzbeitrag, Elektronische Publikation
Fraunhofer IIS, Institutsteil Entwurfsautomatisierung (EAS) ()
aging simulation; degradation model; transistor reliability; qualification

Abstract
To verify the reliability of electronic circuits and systems in automotive applications, qualification according to the industry-standards, such as AEC-Q100, is state of the art. But will it be sufficient for future applications? Simulation-based reliability assessments in IC and system development are intended to complement qualification and allow efficient investigations of product reliability. Aging simulations for analog circuits have been available for years, but are hardly used. This article discusses degradation models as one bottleneck, outlines different requirements and approaches, and points to standards that could be a future solution.

: http://publica.fraunhofer.de/dokumente/N-618126.html