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Quality prediction of open educational resources a metadata-based approach

 
: Tavakoli, M.; Elias, M.; Kismihok, G.; Auer, S.

:

Chang, M. ; Institute of Electrical and Electronics Engineers -IEEE-:
20th IEEE International Conference on Advanced Learning Technologies, ICALT 2020 : 6-9 July 2020, online : proceedings
Piscataway, NJ: IEEE, 2020
ISBN: 978-1-72816-090-0
ISBN: 978-1-72816-091-7
S.29-31
International Conference on Advanced Learning Technologies (ICALT) <20, 2020, Online>
Englisch
Konferenzbeitrag
Fraunhofer IAIS ()

Abstract
In the recent decade, online learning environments have accumulated millions of Open Educational Resources (OERs). However, for learners, finding relevant and high quality OERs is a complicated and time-consuming activity. Furthermore, metadata play a key role in offering high quality services such as recommendation and search. Metadata can also be used for automatic OER quality control as, in the light of the continuously increasing number of OERs, manual quality control is getting more and more difficult. In this work, we collected the metadata of 8,887 OERs to perform an exploratory data analysis to observe the effect of quality control on metadata quality. Subsequently, we propose an OER metadata scoring model, and build a metadata-based prediction model to anticipate the quality of OERs. Based on our data and model, we were able to detect high-quality OERs with the F1 score of 94.6%.

: http://publica.fraunhofer.de/dokumente/N-614623.html