Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

A Model-to-Circuit Compiler for Evaluation of DNN Accelerators based on Systolic Arrays and Multibit Emerging Memories

 
: Knödtel, J.; Fritscher, M.; Reiser, D.; Fey, D.; Breiling, M.; Reichenbach, M.

:

Institute of Electrical and Electronics Engineers -IEEE-:
9th International Conference on Modern Circuits and Systems Technologies, MOCAST 2020 : 7-9 September 2020, Bremen, Germany, virtual conference
Piscataway, NJ: IEEE, 2020
ISBN: 978-1-7281-6687-2
ISBN: 978-1-7281-6688-9
6 S.
International Conference on Modern Circuits and Systems Technologies (MOCAST) <9, 2020, Online>
Englisch
Konferenzbeitrag
Fraunhofer IIS ()

Abstract
With the emergence of DNN accelerators the main focus of such systems usually lies on utilizing local memories and reducing the size of the processed data, since delay and energy consumption are dominated by data transfer. Utilizig emerging memory technologies, such as ReRAMs, these goals might be attained much easier, due to advantageous non-functional and functional properties.One of the key drawbacks of such systems are reliability and variability of devices of such technologies. To certain degree, DNNs are resilient to soft and hard errors in their memory cells, so these issues might be surmountable depending on the device properties, but eludes trivial analyses known from the digital domain. Here the dynamic behavior of the devices comes into play and must be simulated in order to get a decent degree of confidence on the reliability of the hardware and therefore also yield.In order to tackle this issue we present an accelerator architecture and matching analysis pi peline that allows the user to specify and train a net topology and then test the design against some input activations with different randomized device properties. Using this approach we can estimate the inference results and other system and algorithm level properties in presence of different device level properties which might for example be extracted from real world measurements. Such a system can help the user in the design of their net or give them hints on the required device properties for a given net or aid them in evaluating existing designs.

: http://publica.fraunhofer.de/dokumente/N-614523.html