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Assessment of the influencing parameters of the tumble test for robustness testing of smartphones

 
: Dobs, Tom; Sánchez, David; Schischke, Karsten; Wittler, Olaf; Schneider-Ramelow, Martin

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Volltext (PDF; - Gesamter Tagungsband)

Schneider-Ramelow, Martin ; Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration -IZM-, Berlin; TU Berlin:
International Congress "Electronics Goes Green 2020+". Proceedings : The Story of Daisy, Alexa and Greta, September 1, 2020, Berlin, Germany, virtual
Stuttgart: Fraunhofer Verlag, 2020
ISBN: 978-3-8396-1659-8
S.515-520
International Congress "Electronics Goes Green 2020+" <2020, Online>
Englisch
Konferenzbeitrag, Elektronische Publikation
Fraunhofer IZM ()

Abstract
In the wake of increasing attention being paid to robustness and durability of electronic products in general and smartphones in particular, the tumble test is gaining relevance when it comes to emulate real life scenarios of falls and accidental drops. Unlike other drop tests, the tumble test is a fast way to simulate random falls close to real life accidents. There is currently a standard (IEC 60068-2-31) for such testing that sets certain parameters (i.e. the spinning speed, the fall height…) depending on the size and weight of the device under test but leaves enough room for calibration. This study aims to take a closer look to the effect of a variation of those parameters in the experiment. For that, several devices are tested under different conditions and indicators like the fall statistics are collected and then correlated with the test variables. To achieve this, a high-speed camera is used in order to be able to see what happens during impact. As an outcome, this leads to a better understanding on how these parameters can lead to a more accurate simulation of real life conditions as well as the current limitations of the procedure.

: http://publica.fraunhofer.de/dokumente/N-608739.html