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PV Backsheet Failure Analysis by Scanning Acoustic Microscopy

 
: Mansour, D.E.; Kotterer, S.; Philipp, D.; Gebhardt, P.

:
Volltext urn:nbn:de:0011-n-6061622 (595 KByte PDF)
MD5 Fingerprint: 6b663b9d8e49d0025cfd0edffa92a903
Erstellt am: 12.11.2020


Pearsall, Nicola (ed.):
37th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2020 : 07-11 September 2020, Online Conference
München: WIP, 2020
ISBN: 3-936338-73-6
S.1014-1018
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) <37, 2020, Online>
Englisch
Konferenzbeitrag, Elektronische Publikation
Fraunhofer ISE ()
Photovoltaik; Photovoltaische Module und Kraftwerke; Gebrauchsdauer- und Schadensanalyse; acoustic microscopy; cracking; PV module; aging; combined aging

Abstract
Photovoltaic module failure modes associated with backsheet degradation have a high relevance in the operation and maintenance of power plants. In this work, field-exposed modules are analyzed by Scanning Acoustic Microscopy (SAM) to visualize and localize backsheet failure modes in specific layers non-destructively. Acoustic micrographs were collected from material depths of the backsheet and allowed the visualization and assessment of depth profiles of the embedded PV module components individually. Multiple types of interlayer cracks were identified. These local defects of the backsheet were validated by microscopy images of destructively acquired backsheet cross-section samples. Additionally, the backsheet cracking are reproduced in laboratory under UV-DH combined aging test.

: http://publica.fraunhofer.de/dokumente/N-606162.html